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Optical active testing module JW1620
    Publish time 2021-03-30 10:44    
Product overview

It can monitor the current of the laser chip, cooperate with the high-low temperature test box to monitor the high-low temperature aging test, automatically determine the threshold value and generate the data curve.


⚫ Chip clamps are customizable
⚫ Test Path customizable
⚫ Test Data visualization
⚫ Test Time can be set
⚫ Testing laser chip aging
⚫ Automatic determination of test data threshold