JW18001 LDM aging test system for laser chips, Chip, Bar bars, bare Die and COC devices. The software and hardware design is based on the system architecture and the separation fixture. The main machine is installed in a standard 19-inch cabinet. The interface is easy to operate and the data is graphical. Design of different types of aging test fixture, suitable for different packaging, different sizes of devices. After the aging process is completed, the fixture can be directly placed on a constant temperature test platform to complete the LIV curve, spectrum and extinction ratio of the device.
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