It can monitor the current of the laser chip, cooperate with the high-low temperature test box to monitor the high-low temperature aging test, automatically determine the threshold value and generate the data curve.
Features
⚫ Chip clamps are customizable ⚫ Test Path customizable ⚫ Test Data visualization ⚫ Test Time can be set ⚫ Testing laser chip aging ⚫ Automatic determination of test data threshold
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